Regensburg 2019 – scientific programme
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O: Fachverband Oberflächenphysik
O 93: Plasmonics & Nanooptics VI: Near-Field Microscopy and Phenomena
O 93.8: Talk
Friday, April 5, 2019, 12:15–12:30, H8
Hyperspectral nano-imaging applied to s-SNOM enabled by compressed sensing — •Georg Ulrich1, Bernd Kästner1, Franko Schmähling1, Andrea Hornemann1, Arne Hoehl1, Mattias Kruskopf1, Klaus Pierz1, Markus B. Raschke2, Gerd Wübbeler1, and Clemens Elster1 — 1Physikalisch-Technische Bundesanstalt, Braunschweig and Berlin, Germany — 2Department of Physics, Department of Chemistry, and JILA, University of Colorado, Boulder, 80309, USA
Scattering-type scanning near-field optical microscopy (s-SNOM) enables to circumvent the diffraction limit known from classical optics. Ultra-broadband synchrotron radiation from the Metrology Light Source (MLS) provides infrared-radiation suited for performing nano-FTIR spectroscopy [1]. However, for many applications such as mapping of biological samples hyperspectral imaging is required, resulting in a large number of spectra and therefore long acquisition time. Here we will present results from applying compressed-sensing, providing both rapid and sensitive spatio-chemical nano-imaging [2]. By reducing the number of sampling points to 1/9th we are on the route for further enhancing the compression rate to record large data cubes. [1] P. Hermann, et al., Opt. Express. 22, 17948 (2014) [2] B. Kästner, et al., Opt. Express. 26, 18115 (2018)