Rostock 2019 – scientific programme

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A: Fachverband Atomphysik

A 35: Precision Spectroscopy of atoms and ions

A 35.17: Poster

Thursday, March 14, 2019, 16:15–18:15, S Fobau Physik

Towards a XUV frequency comb for high resolution spectroscopy on highly charged ions — •Alexander Ackermann, Janko Nauta, Jan Hendrik Oelmann, Julian Stark, Steffen Kühn, José Crespo López-Urrutia, and Thomas Pfeifer — Max-Planck-Institute for Nuclear Physics, Heidelberg, Germany

Highly charged ions (HCI) have been proposed as a candidate for novel frequency standards [1] and for testing of the variation of the fine structure constant [2]. To carry out high resolution spectroscopy on forbidden transitions in HCIs, stable and coherent extreme ultraviolet (XUV) radiation is required. The nonlinear process of high harmonic generation in a gas target in the focus region of a femtosecond enhancement cavity located in a vacuum chamber, is used to convert a near infrared frequency comb into the XUV [3]. A home built chirped pulse amplification system, containing a prism- and grating-based pulse compressor, which enables compensation of second and third order dispersion, is employed to reach 70 W of sub-200 fs pulses at a repetition rate of 100 MHz. Pulses are characterized with a second harmonic frequency-resolved optical gating setup, based on a self developed Echelle grating spectrometer and an autocorrelator.

[1] V.A. Dzuba et al., Phys. Rev. A 86, 054502 (2012)

[2] J.C. Berengut et al., Phys. Rev. Lett. 106, 210802 (2011)

[3] J. Nauta et al., ScienceDirect 408, Pages 285-288 (2017)