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Q: Fachverband Quantenoptik und Photonik

Q 39: Ultrashort Laser Pulses

Q 39.5: Vortrag

Mittwoch, 13. März 2019, 15:15–15:30, S SR 211 Maschb.

Single-shot temporal characterization of extreme ultraviolet pulses with duration from sub 15 fs to 350 fs at the Free Electron Laser in Hamburg. — •Ivette Jazmin Bermudez Macias¹, Stefan Düsterer¹, Rosen Ivanov¹, Günter Brenner¹, Jia Liu², Andrey Kazansky³, Nikolay Kabachnik¹, and Juliane Rönsch-Schulenburg¹ — ¹Deutsches Elektronen-Synchrotron — ²European XFEL — ³University of the Basque Country UPV/EHU

We present the results of a single-shot temporal charachterization of extreme ultraviolet (XUV) Free-electron Laser (FEL) pulses generated by the Free electron Laser in Hamburg (FLASH) at DESY, measured with a THz-field-driven streaking setup.

In order to investigate the limits of this technique, measurements were taken at different pulse durations, from sub 10fs to ~300fs, and different XUV wavelengths. Limits and possible error sources of the diagnostic method are discussed. Furthermore, the single-shot XUV pulse duration measurement allows the detailed investigation of the interplay between different properties of the strongly fluctuating self-amplified spontaneous emission (SASE) radiation. Correlations between pulse duration, pulse energy, spectral distribution, arrival time, electron bunch shapes,... are explored in the experimental data as well as in simulations. In addition, the results of different pulse reconstruction methods to retrieve the actual XUV pulse shape have been compared.