Bonn 2020 – scientific programme

The DPG Spring Meeting in Bonn had to be cancelled! Read more ...

Parts | Days | Selection | Search | Updates | Downloads | Help

T: Fachverband Teilchenphysik

T 13: Pixel detectors I

T 13.5: Talk

Monday, March 30, 2020, 17:30–17:45, H-HS XIV

Characterization of Planar Pixel Sensors for the CMS Phase 2 Upgrade — •Finn Feindt¹, Aliakbar Ebrahimi¹, Erika Garutti¹, Caroline Niemeyer¹, Daniel Pitzl², Georg Steinbrück¹, Jörn Schwandt¹, and Irene Zoi¹ — ¹Institute for Experimental Physics, Hamburg University, Luruper Chaussee 149, D-22761 Hamburg, Germany — ²Deutsches Elektronen-Synchrotron, Notkestraße 85, D-22607 Hamburg, Germany

The CMS Pixel Detector for the Phase 2 Upgrade of the CMS Experiment will have to withstand a 1 MeV neutron equivalent fluences φ_eq of up to 2 × 10¹⁶ cm⁻² at 2.8 cm distance from the beam and enable tracking in a high track multiplicity environment caused by up to 200 proton collisions per bunch crossing.

To meet these requirements, planar pixel sensors with pixel sizes of 50×50 µm² or 100×25 µm² and an active thickness of 150 µm were designed, produced and characterized after proton or neutron irradiation to φ_eq above 5 × 10¹⁵ cm⁻², corresponding to the fluence expected in the second layer of the CMS Pixel Detector. The sensors differ in the design of implantation, metalization and biasing scheme and the pixel isolation technology.

The presented results show that the irradiated planar pixel sensors fulfill the requirement of efficiency є = 0.99 at operation voltages below 800 V. In addition, the characterization and comparison of the different sensor designs provide valuable input for the final choice of the sensor design.