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T 13: Pixel detectors I
Montag, 30. März 2020, 16:30–18:00, H-HS XIV
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16:30 |
T 13.1 |
Quality Control Measurements of RD53A on Wafer- and Module Level — •Michael Daas, Markus Frohne, Tomasz Hemperek, Florian Hinterkeuser, Fabian Hügging, Hans Krüger, David-Leon Pohl, Mark Standke, Marco Vogt, Norbert Wermes, and Jochen Dingfelder
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16:45 |
T 13.2 |
Characterization of RD53A modules using x-ray fluorescence — •Sascha Dungs, Kevin Kröninger, Susanne Kühn, Lingxin Meng, and Heinz Pernegger
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17:00 |
T 13.3 |
Charge Calibration and Crosstalk Measurements with RD53A Assemblies — •Georgios Giakoustidis
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17:15 |
T 13.4 |
Characterization of a depleted monolithic active pixel sensor in 180 nm TowerJazz technology — Ivan Berdalovic, •Christian Bespin, Ivan Caicedo Sierra, Leyre Flores Sanz De Acedo, Tomasz Hemperek, Toko Hirono, Fabian Hügging, Hans Krüger, Thanusan Kugathasan, Cesar Augusto Marin Tobon, Konstantinos Moustakas, Heinz Pernegger, Walter Snoeys, Tianyang Wang, Norbert Wermes, and Jochen Dingfelder
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17:30 |
T 13.5 |
Characterization of Planar Pixel Sensors for the CMS Phase 2 Upgrade — •Finn Feindt, Aliakbar Ebrahimi, Erika Garutti, Caroline Niemeyer, Daniel Pitzl, Georg Steinbrück, Jörn Schwandt, and Irene Zoi
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17:45 |
T 13.6 |
Capacitance measurements on silicon pixel sensors for ATLAS ITk — •Evelyn Kimmerle, Hans Krüger, and Norbert Wermes
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