Dresden 2020 – scientific programme
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CPP: Fachverband Chemische Physik und Polymerphysik
CPP 49: Poster Session II
CPP 49.23: Poster
Tuesday, March 17, 2020, 14:00–16:00, P1A
GI/T-XPCS for slot-die coated perovskite thin films — •Christopher Greve1, Michael Buchhorn1, Dinesh Kumar2, Alexander Hexemer2, Lutz Wiegart3, and Eva M. Herzig1 — 1Dynamik und Strukturbildung - Herzig Group, Universität Bayreuth, Universitätsstraße 30, 95447 Bayreuth, Germany — 2Advanced Light Source, Lawrence Berkeley National Lab, 1 Cyclotron Road, Berkeley Ca 94720, USA — 3NSLSII, Brookhaven National Lab, Brookhaven Avenue, Upton NY, USA
X-Ray Correlation Spectroscopy (XPCS) is a useful tool to investigate the dynamics and the morphology of hard and soft condensed matter. Via XPCS, it is possible to probe length scales < 100nm and time scales >10-4s. To obtain information about the underlying dynamics, the correlations of the scattered intensity (speckles) in a time series are investigated. We use XPCS to investigate slot-die coated thin films in situ in gracing incident (GI) and gracing incident transmission (GT) geometry to gain insights in the underlying processes of thin film formation. For printing, an up-scalable printer setup is used and as a system methylammonium lead iodide (MAPI) is featured. MAPI is known for its solar cells applications, but the underlying processes of thin film formation are poorly understood. XPCS offers the possibility to investigate the dynamics in the evolving MAPI thin film. In our approach the optimized GT geometry allows to model the data in the born approximation, thus to ignore multiple scattering events from the thin film and the need to consider their impact on extracted dynamics.