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DS 9: Optical Analysis of Thin Films
Monday, March 16, 2020, 15:00–16:15, CHE 91
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15:00 |
DS 9.1 |
The contribution has been moved to DS 24.6.
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15:15 |
DS 9.2 |
Validation of Optical Constants in the EUV Spectral Range — •Qais Saadeh, Victor Soltwisch, Frank Scholtze, and Philipp Naujok
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15:30 |
DS 9.3 |
Grazing incidence X-ray fluorescence measurement on nanostructures for element sensitive reconstruction — •Anna Andrle, Philipp Hönicke, Philipp-Immanuel Schneider, Yves Kayser, Martin Hammerschmidt, Sven Burger, Frank Scholze, Burkhard Beckhoff, and Victor Soltwisch
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15:45 |
DS 9.4 |
Ultrafast time-resolved spectroscopic ellipsometry user station at ELI-Beamlines — •Martin Zahradník
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16:00 |
DS 9.5 |
Excitonic Wave Function Reconstruction from Near-Field Spectra Using Machine Learning Techniques — Fulu Zheng and •Alexander Eisfeld
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