Dresden 2020 – wissenschaftliches Programm

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HL: Fachverband Halbleiterphysik

HL 63: Focus: High-resolution Lithography and 3D Patterning (Part II) (joint session KFM/CPP/HL)

HL 63.3: Vortrag

Donnerstag, 19. März 2020, 10:10–10:30, TOE 317

Additive technology for X-ray optical applications — •Adam Kubec, Frieder Koch, and Christian David — Paul Scherrer Institut

X-ray optics are used in many setups connected to materials analysis. Due to very different properties of X-rays as compared to visible light different challenges, have to be tackled in order to manufacture optics. The refractive index has only a small difference to unity. This results in a relatively small optical power. This makes it challenging to manufacture refractive lenses. A successful concentration of X-ray using refractive lenses could only been shown in 1996 using a set of individual refractive lenses.

Today refractive lenses for X-rays are commercially available and are widely used in many synchrotron radiation sources. However, it is still challenging to manufacture aberration free lenses for X-rays. Therefore, custom-made radially symmetric corrector phase plates are used to reduce the aberrations. Spiral phase plates can generate X-ray beams carrying orbital angular momentum of various topological charges.

Additive technology can now also used in order to manufacture refractive lenses directly. Due to the versatility of 3D printed geometries, it is possible to manufacture lenses adapted specifically to improve measuring techniques, such as Ptychography.

We will also see further applications of 3D printing for X-ray applications such as 3D resolution pattern (Siemens Star). These can be can be used to quantify the quality of X-ray tomography setups.