Dresden 2020 – wissenschaftliches Programm
Die DPG-Frühjahrstagung in Dresden musste abgesagt werden! Lesen Sie mehr ...
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
HL: Fachverband Halbleiterphysik
HL 75: Poster IIIB
HL 75.26: Poster
Donnerstag, 19. März 2020, 15:00–17:30, P2/3OG
Dielectric function tensor of ZnO microwires determined by spatially resolved spectroscopic ellipsometry — •Noha Hill1, Matthias Duwe2, Sebastian Funke2, Chris Sturm3, Lukas Trefflich3, Marius Grundmann3, Stefan Krischok1, and Rüdiger Schmidt-Grund1 — 1Institut für Physik, Technische Universität Ilmenau, Weimarer Straße 25, 98693 Ilmenau, Germany — 2Accurion GmbH, Stresemannstr. 30, 37079 Göttingen, Germany — 3Felix-Bloch-Institut für Festkörperphysik, Universität Leipzig, Linnéstr. 5, 04103 Leipzig, Germany
ZnO-based nano- and microwire microcavities are very promising systems for room-temperature lasing and quantum-optical applications [1]. But up to know, the optical dispersion functions are not known exactly, there is much evidence that they differ from that of single crystalline bulk material. We have obtained the dielectric function tensor from a single microwire by imaging ellipsometry. The measurements and geometrical conditions provide us with data from three different experimental configurations simultaneously: i) signals from reflection at the top facet of the wire, ii) the same but superimposed with reflections from the wires backside, iii) signals where the light is normally transmitted through the wire and reflected at the substrate. All those were measured for two types of substrates which are SiO2/Si as well as gold. Especially the transmitted signal, in configuration perpendicular to the wires axis and thus to the crystals c- or optic axis, gives us a very sensitive access to the materials birefringence.
[1] R. Schmidt-Grund et al., phys stat sol b, 256, 1800462 (2019).