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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur

KFM 11: Ferroics - Domains and Domain Walls (joint session KFM/MA)

KFM 11.6: Vortrag

Mittwoch, 18. März 2020, 17:00–17:20, TOE 317

Ferroelectric domain wall imaging by focused ion beam — •Erik Roede¹, Aleksander Mosberg¹, Donald Evans¹, Theodor Holstad¹, Zewu Yan², Edith Bourret³, Antonius van Helvoort¹, and Dennis Meier¹ — ¹NTNU, Trondheim, Norway — ²ETH, Zurich, Switzerland — ³Lawrence Berkeley National Laboratory, Berkeley, CA, USA

Charged ferroelectric domain walls (DWs) have received much attention for their functional properties and potential applications [1]. The orientation of a DW relative to the ferroelectric polarization determines the charge state and electronic properties of the wall. Therefore, the propagation of DWs through a crystal has drastic effects on the properties measured at the surface. Still, research on DWs has so far been dominated by surface techniques.

In this work, we introduce the use of focused ion beam (FIB) techniques [2] for 3D domain and DW imaging in ErMnO3[3] with nanoscale resolution. This enables relating the measured surface properties to the 3D domain wall geometry, enabling a move towards a comprehensive knowledge of the intrinsic properties of charged ferroelectric domain walls and their application in future nanoelectronic devices.

[1] D. Meier et al., Nature Materials, 11, 284-288 (2012) [2] A. Mosberg et al., Appl. Phys. Lett. 115, 122901 (2019) [3] Z. Yan et al., J. Cryst. Growth, 409, 75-79 (2015)