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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur

KFM 14: TEM-based Nanoanalysis and Microstructure of thin films (joint session KFM/CPP)

KFM 14.6: Vortrag

Donnerstag, 19. März 2020, 16:00–16:20, HSZ 301

Characterizing self-assembled nanostructures in a hierarchical-structured film by coherent two-dimensional microscopy — •Donghai Li¹, Evgenii Titov¹, Maximilian Roedel², Verena Kolb², Sebastian Goetz¹, Roland Mitric¹, Jens Pflaum^2,3, and Tobias Brixner¹ — ¹Institut für Physikalische und Theoretische Chemie, Universität Würzburg, Am Hubland, 97074 Würzburg, Germany — ²Lehrstuhl für Experimentelle Physik VI, Universität Würzburg, Am Hubland, 97074 Würzburg, Germany — ³Bavarian Center for Applied Energy Research e.V. (ZAE Bayern), Magdalene-Schoch-Str. 3, 97074 Würzburg, Germany

Self-assembled nanostructures facilitate the development of functional materials with widely tunable properties. Hierarchical architectures consist of nanoscale building blocks spatially modulated by microscale patterns. Despite its relevance for applications and devices, characterization is demanding with existing methods because typically the local molecular-scale assembly pattern within the nanostructure cannot be resolved. Here, we determine nanostructure morphology in a hierarchically structured organic film using coherent two-dimensional (2D) micro-spectroscopy in combination with theoretical modelling of excitonic spectra. We obtain local 2D spectra with diffraction-limited spatial resolution of 260 nm. Using first principles calculations of exciton spectra for model aggregates we connect the experimentally observed signal to the characteristic lengthscale of the nanocrystallites. Thus we obtain a spatial map of nanoscale self-assembly size and confirm it to be correlated with the local slope of the microstructured film surface.