Dresden 2020 – scientific programme

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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur

KFM 14: TEM-based Nanoanalysis and Microstructure of thin films (joint session KFM/CPP)

Thursday, March 19, 2020, 14:10–16:20, HSZ 301

Chair: Bernd Rellinghaus (Dresden Center for Nanoanalysis, TU Dresden)

	14:10	KFM 14.1	The effect of dynamical scattering in ferroelectrics on the measurements of internal electric fields by momentum-resolvedSTEM — •Achim Strauch, Andreas Rosenauer, Andrei Sokolov, Evgeny Tsymbal, and Knut Müller-Caspary
	14:30	KFM 14.2	A Novel High-Pressure Tin Oxynitride Sn2N2O — •Philipp Gollé-Leidreiter, Shrikant Bhat, Leonore Wiehl, Ute Kolb, and Ralf Riedel
	14:50	KFM 14.3	The role of spatial coherence for the creation of and imaging with atom size electron vortex beams — •Darius Pohl, Stefan Löffler, Sebastian Schneider, Peter Tiemeijer, Sorin Lazar, Kornelius Nielsch, and Bernd Rellinghaus
	15:10		10 min. break
	15:20	KFM 14.4	Ferroelectric and structural properties of epitaxial NaxBi1-xTiO3 and BaxSr1-xTiO3 based thin films for electrocaloric studies — •Bruno Magalhaes, Stefan Engelhardt, Christian Molin, Sylvia Gebhardt, Kornelius Nielsch, and Ruben Hühne
	15:40	KFM 14.5	Uncloaking structural information of ultra-thin oxide films by surface enhanced Raman spectroscopy — •Mads C. Weber, Sebastian Heeg, Roman Wyss, Martin Sarott, Morgan Trassin, and Manfred Fiebig
	16:00	KFM 14.6	Characterizing self-assembled nanostructures in a hierarchical-structured film by coherent two-dimensional microscopy — •Donghai Li, Evgenii Titov, Maximilian Roedel, Verena Kolb, Sebastian Goetz, Roland Mitric, Jens Pflaum, and Tobias Brixner