Dresden 2020 – wissenschaftliches Programm
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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur
KFM 15: Postersession KFM
KFM 15.30: Poster
Donnerstag, 19. März 2020, 16:00–18:30, P2/1OG
Structural Investigations and Stacking Faults in the Quasi 2D van der Waals Layered Compound Ni2P2S6 — •Sebastian Selter1,2, Adam P. Dioguardi1, Hans-Joachim Grafe1, Mihai-Ionut Sturza1, Saicharan Aswartham1, and Bernd Buechner1,2 — 1Institute for Solid State Research, Leibniz IFW Dresden, Helmholtzstr. 20, 01069 Dresden, Germany — 2Institute of Solid State and Materials Physics, Technische Universität Dresden, 01062 Dresden, Germany
Van der Waals layered compounds, such as the structural family of T2P2S6 (T = 3d transition metal) or CrX3 (X = Cl, Br, I), recently moved in the focus of research due to the interplay between magnetism and a quasi two dimensional structural lattice. However, such van der Waals layered compounds are prone to exhibit crystallographic defects along the stacking direction, because of weak structural interactions between layers. Understanding the stacking behavior in these compounds is key to disentangle intrinsic and defect driven physical phenomena.
Here, we present a comprehensive investigation on Ni2P2S6 by X-ray diffraction methods. Strong evidence is found for a high concentration of stacking faults along the c*-direction. As the magnetic easy axis of Ni2P2S6 is found parallel to the a-direction in the monoclinic unit cell, in-plane rotation studies in the magnetically ordered state by magnetometry and 31P-NMR allow further insight in the nature of these defects. Resulting from these studies, stacking faults are found to be well defined by a 60∘ rotational twinning in this compound.