Dresden 2020 – scientific programme
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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur
KFM 17: Microstructure, Real Structure and Crystal Defects
KFM 17.1: Talk
Friday, March 20, 2020, 09:30–09:50, TOE 317
Emitter-Site Specificity of Hard X-ray Photoelectron Kikuchi-Diffraction — •Olena Fedchenko1, Aimo Winkelmann2, Sergey Chernov1, Katerina Medjanik1, Sergey Babenkov1, Steinn Agustsson1, Dmitry Vasilyev1, Moritz Hoesch3, Hans-Joachim Elmers1, and Gerd Schönhense1 — 1JGU, Institut für Physik, Mainz, Germany — 2ACMiN, AGH University of Science and Technology, Krakow, Poland — 3DESY Photon Science, Hamburg, Germany
High-resolution full-field imaging of (kx,ky) photoelectron distributions (angular resolution 0.03∘) in a large field of view (up to 20 Å−1 dia.) gives access to subtle details in Kikuchi-type diffractograms [1]. This method opens a new avenue to structural analysis via hard X-ray Photoelectron Diffraction (hXPD). We present a theoretical study of the emitter-site specificity by simulating hXPD patterns for arbitrary positions of emitter atoms in the unit cell. Using the Bloch wave approach to photoelectron diffraction from lattice planes [2], the diffraction patterns from an arbitrary number of positions in the unit cell can be obtained simultaneously making use of the reciprocity theorem. Simulations for emitter atoms at various positions in the unit cell of silicon reveal surprisingly strong changes (despite the fact that the entire lattice is kept fixed). The results are compared with measurements for Si doped with Te using ion-implantation [3].
[1] O. Fedchenko et al., New J. of Phys, 21,113031 (2019); [2] A. Winkelmann et al., New J. of Phys. 10, 113002 (2008); [3] M. Hoesch et al., this conference.