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09:30 |
KFM 17.1 |
Emitter-Site Specificity of Hard X-ray Photoelectron Kikuchi-Diffraction — •Olena Fedchenko, Aimo Winkelmann, Sergey Chernov, Katerina Medjanik, Sergey Babenkov, Steinn Agustsson, Dmitry Vasilyev, Moritz Hoesch, Hans-Joachim Elmers, and Gerd Schönhense
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09:50 |
KFM 17.2 |
The influence of trace element additions to Al-1.7 at.% Cu alloys: preservation of quenched-in vacancies and atomistic mechanisms supporting θ ′ — •Torsten E.M. Staab, Frank Lotter, Uwe Mühle, Mohamed Elsayed, Danny Petschke, Thomas Schubert, Alaa M. Ibrahim, Reinhard Krause-Rehberg, and Bernd Kieback
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10:10 |
KFM 17.3 |
Using atomic force microscopy to tune functionality at the nanoscale — •Donald M. Evans, Theodor S. Holstad, Aleksander B. Mosberg, Didrik R. Småbråten, Per E. Vullum, Anup L. Dadlani, Zewu Yan, Edith Bourret-Courchesne, Jan Torgersen, Antonius T. J. van Helvoort, Sverre M. Selbach, and Dennis Meier
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10:30 |
KFM 17.4 |
Exploring electronic properties of topological insulators using nuclear magnetic resonance — •Robin Guehne and Jürgen Haase
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10:50 |
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20 min. break
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11:10 |
KFM 17.5 |
Hidden Diversity of Vacancy Orderings in Prussian Blue Analogues — •Arkadiy Simonov, Hanna B. Boström, and Andrew L. Goodwin
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11:30 |
KFM 17.6 |
Structural defects in silicon observed in situ by X-ray diffraction imaging during heating and solidification — •Maike Becker, Gabrielle Regula, Serge W. Neves Dias, Hadjer Ouaddah, Guillaume Reinhart, and Nathalie Mangelinck-Noël
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11:50 |
KFM 17.7 |
Examination of defects and lattice vibrations in rare and common polytypes of Silicon Carbide — •Maximilian von Roeder, Jurek Lange, Detlev Hofmann, Sangam Chatterjee, and Peter Klar
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12:10 |
KFM 17.8 |
Investigation of the real structure by means of unconventional methods of the analytical electron microscopy — •Enrico Langer
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