Dresden 2020 – wissenschaftliches Programm

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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur

KFM 5: Microscopy and Spectroscopy with X-rays, Ions and Positrons (joint session KFM/CPP)

Montag, 16. März 2020, 15:00–17:40, TOE 317

Chair: Enrico Langer (TU Dresden)

	15:00	KFM 5.1	Single-Shot Phase-Contrast Microscopy of Laser-induced Cavitation at MID/EuXFEL — •Johannes Hagemann, Malte Vassholz, Hannes Höppe, Markus Osterhoff, Juan Rosello, Robert Mettin, Andreas Schropp, Christian Schroer, and Tim Salditt
	15:20	KFM 5.2	Latest developments in multi-modal scanning X-ray microscopy — •Michael Stuckelberger
	15:40	KFM 5.3	Experimental optimization of geometry for propagation based phase contrast X-ray imaging — •Hanna Dierks and Jesper Wallentin
	16:00	KFM 5.4	Multiscale Mapping and Quantification of Elastic Stress and Domain Size in Bulk Ferroelastic Systems by Dark-Field X-Ray Microscopy — •Jan Schultheiß, Lukas Porz, Lalitha Kodumudi Venkataraman, Marion Höfling, Semen Gorfman, Jürgen Rödel, and Hugh Simons
	16:20	KFM 5.5	Soft X-ray Laminography adds a third dimension to STXM — Katharina Witte, •Andreas Späth, Simone Finizio, Claire Donnelly, Michal Odstrcil, Manuel Guizar-Sicairos, Mirko Holler, Benjamin Watts, Rainer H. Fink, and Jörg Raabe
	16:40		20 min. break
	17:00	KFM 5.6	Detection system for transmission imaging in helium ion microscope — •Eduardo Serralta, Nico Klingner, Olivier De Castro, Serge Duarte Pinto, Cecilia Bebeacua, Stefan Findeisen, Olivier Bouton, Tom Wirtz, and Gregor Hlawacek
	17:20	KFM 5.7	Positron Annihilation Studies using a Superconducting Electron Linac — •Maik Butterling, Andreas Wagner, Maciej Oskar Liedke, Eric Hirschmann, Ahmed G. Attalah, Reinhard Krause-Rehberg, and Kay Potzger