Dresden 2020 – wissenschaftliches Programm

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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur

KFM 5: Microscopy and Spectroscopy with X-rays, Ions and Positrons (joint session KFM/CPP)

KFM 5.4: Vortrag

Montag, 16. März 2020, 16:00–16:20, TOE 317

Multiscale Mapping and Quantification of Elastic Stress and Domain Size in Bulk Ferroelastic Systems by Dark-Field X-Ray Microscopy — •Jan Schultheiß^1,2, Lukas Porz¹, Lalitha Kodumudi Venkataraman¹, Marion Höfling¹, Semen Gorfman³, Jürgen Rödel¹, and Hugh Simons⁴ — ¹Department of Materials and Earth Sciences, TU Darmstadt, Germany — ²Department of Materials Science and Engineering, NTNU Trondheim, Norway — ³Department of Materials Science and Engineering, Tel Aviv University, Israel — ⁴Department of Physics, DTU, Denmark

Twinned domains in ferroelastic systems are intimately coupled to local strain fields. Problematically, in complex oxides this coupling often spans over several orders of magnitude of length scale. State-of-the art characterization techniques, however, either lack spatial resolution or their sensitivity is limited to the surface.
Here we use Dark-field X-Ray Microscopy to map and quantify spatial variations of elastic stress and domain size from nm to several µm in a grain of a polycrystalline ferroelectric/ferroelastic (Ba,Ca)(Zr,Ti)O₃ model system as a function of the applied electric field. We find, that the electric field narrows the distribution of elastic stresses by 60%, while the domain size increases by 35%. The suggested methodology can be applied to multiscale correlations in emerging fields in complex oxides and twinned systems.