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MA: Fachverband Magnetismus

MA 57: Posters Magnetism II

MA 57.49: Poster

Donnerstag, 19. März 2020, 15:00–18:00, P3

Convergent electron beam diffraction: an old technique applied on new magnetic materials — •Inga Ennen, Bernhard Kaltschmidt, and Andreas Hütten — Universität Bielefeld, Dünne Schichten und Physik der Nanostrukturen, Universitätsstr. 25, 33615 Bielefeld, Germany

Convergent electron beam diffraction (CEBD) is a well-known technique for qualitative and quantitative analysis of crystal structures in a transmission electron microscope (TEM). Here, a convergent electron beam illuminates a small specimen area, typically with a diameter of 10 nm or less, resulting in a disk shaped diffraction pattern. From the intensity distribution of the diffraction pattern sample characteristics like specimen thickness, lattice parameters or features of crystal defects can be determined.

In this contribution we present CBED analysis on magnetic materials like the Co2MnSi Heusler compound as a test sample. Our focus is on the analysis of the lattice parameters and the influence of adjacent V layers on the crystal structure of the Heusler. Furthermore, the advantage of an in-column energy filter for CBED analysis will be demonstrated, which allows us to improve the signal to noise ratio of the diffraction pattern and thus to perform more precise structure analysis.