Die DPG-Frühjahrstagung in Dresden musste abgesagt werden! Lesen Sie mehr ...
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
MM: Fachverband Metall- und Materialphysik
MM 60: Mechanical Properties: Plasticity, fracture, fatigue, wear - I
MM 60.5: Vortrag
Donnerstag, 19. März 2020, 16:45–17:00, IFW B
Size effect in bi-crystalline Cu micropillars with a coherent twin boundary — •Reza Hosseinabadi, Gerhard Dehm, and Christoph Kirchlechner — Max-Planck-Institut für Eisenforschung GmbH
It was recently shown by micropillar compression that the stress for ideal dislocation slip transmission through a Coherent Twin Boundary (CTB) is similar to the stress required for dislocation cross-slip. The difference in shear stress of a single and bi-crystalline micropillar (Δ*2%) can be as low as 7 MPa. A double-hump dislocation shape was proposed to explain the unexpectedly low difference, where an additional curvature of dislocations in bi-crystalline micropillars is necessary to form a perfect screw dislocation required for the cross-slip-like slip transmission.
Aim of this study is to study the size scaling of CTB containing micropillars to validate or revise the double-hump theory. We employ Focused Ion Beam (FIB) machining to mill more than 120 micron-sized single and bi-crystalline pillars with a single vertical Σ3(111) CTB. Subsequently, in situ microcompression experiments inside a scanning electron microscope (SEM) as well as post-mortem imaging using SEM were performed.
Bi-crystalline pillars follow the same size scaling laws as typically observed in micro-pillars, i.e. smaller are substantially stronger. Furthermore, Δ*2% tends to increase with reduced pillar diameters. This effect can be explained by the double-hump theory and will be quantitatively compared to model predictions.