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O: Fachverband Oberflächenphysik
O 100: Electronic Structure of Surfaces II
O 100.6: Vortrag
Donnerstag, 19. März 2020, 11:45–12:00, REC C 213
Multiple scattering x-ray photoelectron diffraction study on the Ni-doped SrTiO3 (100) films — •Fatima Alarab1,2, Sylvain Tricot3, Berengar Leikert4, Matthias Muntwiler5, Karol Hricovini2, Didier Sébilleau3, and Ján Minár1 — 1NTC, University of West Bohemia, Pilsen, Czech Republic — 2LPMS, Université de Paris Seine, Neuville sur-Oise, France — 3IPR, Université de Rennes, Rennes, France — 4RCCM, Universität Würzburg, Würzburg, Germany — 5PSI, Villigen, Switzerland
The atomic surface structure of Ni-doped SrTiO3(100) films grown by pulsed laser deposition (PLD) method with (Ni=6 at% and 12 at%) was investigated by x-ray photoelectron diffraction (XPD) at the PEARL beamline of the Swiss-Light-Source. The main goal is to define Ni impurity locations (Substitutional and/or interstitial positions) in the hosting lattice. The results have been compared to similar XPD measurements on pure SrTiO3(100) films. Ekin of all recorded spectra was chosen to be in the range of 190-198 eV. In this interval of energy, the photoelectron diffraction peaks are assigned by considering not only the forward scattering of photoelectrons by the atomic potential near the emitter atom, but also the backward scattering effects. This makes XPD more sensitive on an atomic scale and useful for local atomic structure analysis down to the monolayer and surface relaxation. With the large number of elastic scattering events, it was necessary to use the multiple scattering package for spectroscopies (MsSpec) in which same experimental conditions used for the XPD data acquisition were applied for the multiple scattering calculations.