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15:00 |
O 18.1 |
Hauptvortrag:
Probing Nanophotonic Modes and Optical Phase Shaping of Electron Beams in Ultrafast Transmission Electron Microscopy — •Armin Feist
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15:30 |
O 18.2 |
Time-resolved and spatially-resolved mode dynamics within a plasmonic nanoslit cavity investigated by coherent two-dimensional nanoscopy — Sebastian Pres, Daniel Friedrich, Daniel Fersch, Enno Krauss, Bernhard Huber, Victor Lisinetskii, •Matthias Hensen, Bert Hecht, and Tobias Brixner
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15:45 |
O 18.3 |
Coherent two-dimensional nanoscopy on coupled plasmonic nanostructures — •Lysanne Monika Dietrich, Daniel Friedrich, Jessica Meier, Enno Krauss, Daniel Fersch, Raphael Wichary, Victor Lisinetskii, Matthias Hensen, Bert Hecht, and Tobias Brixner
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16:00 |
O 18.4 |
THz streaking spectroscopy for mapping the transformation from far-fields to nanostructure near-fields — •Felix Sommer and Georg Herink
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16:15 |
O 18.5 |
Tunable strong coupling — •Daniel Friedrich, Benedikt Schurr, Heiko Gross, and Bert Hecht
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16:30 |
O 18.6 |
Strong coupling in planar metamaterials — •Manuel Gonçalves, Hayk Minassian, and Armen Melikyan
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16:45 |
O 18.7 |
Quantum Coherent Interference Paths in Interaction of Single-Electron Wavepackets with Light — •Nahid Talebi and Christoph Lienau
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17:00 |
O 18.8 |
Strong-Field Angle-Resolved Plasmoemission Spectroscopy — •Pascal Dreher, David Janoschka, Jan-Henrik Herrig, Michael Horn-von Hoegen, and Frank-J. Meyer zu Heringdorf
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17:15 |
O 18.9 |
Nonlinear plasmon-exciton coupling enhances sum-frequency generation from a Au/ZnO nanohybrid — •Jin-Hui Zhong, Jan Vogelsang, Jue-Min Yi, Dong Wang, Lukas Wittenbecher, Sara Mikaelsson, Anke Korte, Abbas Chimeh, Cord L. Arnold, Peter Schaaf, Erich Runge, Anne L'Huillier, Anders Mikkelsen, and Christoph Lienau
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17:30 |
O 18.10 |
fluctuation-modulated third harmonic deep ultraviolet emission from randomly disordered Si nanograss — •Juemin Yi, Dong wang, Jinhui Zhong, Peter Schaaf, Erich Runge, and Christoph Lienau
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17:45 |
O 18.11 |
Electron-Driven Photon-Sources for Spectral Interferometry using Electron Microscopes — Nika van Nielen, Mario Hentschel, Harald Giessen, Albert Polman, and •Nahid Talebi
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