Dresden 2020 – scientific programme
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O: Fachverband Oberflächenphysik
O 28: Poster Session - Scanning Probe techniques: Method Development
O 28.4: Poster
Monday, March 16, 2020, 18:15–20:00, P1A
Simultaneous length extensional- and flexural operation of a qPlus sensor for biaxial force detection. — •Jinglan Qiu1,2, Dominik Kirpal1, and Franz J. Giessibl1 — 1University of Regensburg, Germany — 2Hebei Normal University, Shijiazhuang, China
In dynamic atomic force microscopy, the tip of the cantilever usually is oscillating in the z-direction perpendicular to the surface. By adding a second oscillation in the x-direction, parallel to the surface, lateral forces can be directly investigated. In the case of a silicon cantilever this can be realized by using a torsional mode [1]. In the case of the qPlus sensor, the length extensional mode (LE-mode) can be used, analogous to a needle sensor. However, this requires an adjustment of the electrode configuration. We have prepared a qPlus sensor for the length extensional mode, characterized the properties of the mode and showed the capability of atomic resolution in both, the LE-mode and the lateral 1st flexural mode.
[1] O. Pfeiffer, R. Bennewitz, A. Baratoff, E. Meyer, P. Grütter, Phys. Rev. B, 65, 161403 (2002).