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O: Fachverband Oberflächenphysik
O 52: Poster Session - New Methods: Experiments
O 52.6: Poster
Dienstag, 17. März 2020, 18:15–20:00, P2/1OG
Towards a high-intensity ion source for preparative mass spectrometry — •Paul Fremdling1, Laurent Bernier2, Loukas Kyriakidis2, Julius Reiss2, and Stephan Rauschenbach1 — 1Department of Chemistry, University of Oxford, UK — 2Institut für Strömungsmechanik und Technische Akustik, Technische Unversität Berlin, DE
Preparative Mass Spectrometry (pMS) is an ion beam deposition technique producing highly purified, mass-filtered homogeneous samples of non-volatile compounds such as metal ion clusters(1), sugars(2) or intact Proteins in vacuum(3). High-intensity ion sources are a prerequisite to apply pMS to produce technological coatings on a macroscopic surface as well as to selectively mass-filter and land low-abundance ionic species.(4) However, in current mass spectrometers the transmission efficiency from electrospray to high vacuum is less than a tenth and the maximum ion current achievable is limited to the low nA range(4). We want to overcome this barrier by developing a novel vacuum interface combining a high-capacity transfer capillary(5, 6) with an ion funnel system optimised under fluid dynamics aspects.
1. M. A. Röttgen et al., Rev. Sci. Instrum. 77, 013302 (2006).
2. S. Abb et al., Angew. Chem. Int. Ed. 58, 8336-8340 (2019).
3. J.-N. Longchamp et al., Proc. Natl. Acad. Sci. 114, 1474-1479 (2017).
4. S. Rauschenbach et al., Annu. Rev. Anal. Chem. 9, 473-498 (2016).
5. M. Pauly et al., The Analyst. 139, 1856 (2014).
6. L. Bernier et al., J. Am. Soc. Mass Spectrom., 1-13 (2018).