Dresden 2020 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 62: Focus Session: Big Data in Aquisition in ARPES (joint session O/CPP)

O 62.4: Vortrag

Mittwoch, 18. März 2020, 11:30–11:45, REC C 213

Data Acquisition and Treatment on a Scientific and Industrial Level — •Stefan Böttcher, Christian Fleischer, and Thorsten Kampen — SPECS Surface Nano Analysis GmbH, Voltastrasse 5, 13355 Berlin

The recent developments in angular resolved photoemission and momentum microscopy let arise scientific instruments which produce enormous amount of raw data, easily exceeding several Tb of file size. Solutions or attempts of standard data- or transfer-formats are present in many fields, such as XPS or SPM. Here we present our approach on the data acquisition and processing in the acquisition and analysis software. We show the classes of metadata available to the experiment and the routes to export the data into usable formats. The data handling and the storage of transformation is a critical aspect with the present discussion. Finally an outlook into possibilities for DIN/ISO standardization can be given.