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O: Fachverband Oberflächenphysik
O 74: Nanostructured Surfaces and Thin Films I: Synthesis and Properties (joint session O/CPP)
O 74.1: Vortrag
Mittwoch, 18. März 2020, 15:00–15:15, WIL B321
Imaging the phase transition in thin film VO2 microstructures — •Jan O. Schunck1,2, Florian Döring3, Benedikt Rösner3, Jens Buck4, Sanjoy Mahatha1, Moritz Hoesch1, Christian Schüßler-Langeheine5, Adrian Petraru6, Hermann Kohlstedt6, Kai Rossnagel1,4, Christian David3, and Martin Beye1,2 — 1Deutsches Elektronen-Synchrotron DESY, Hamburg — 2Physics Department, Universität Hamburg — 3Paul Scherrer Institut, Villigen-PSI, Switzerland — 4Institut für Experimentelle und Angewandte Physik, CAU Kiel — 5Helmholtz-Zentrum Berlin — 6Nanoelektronik, Techn. Fakultät, CAU Kiel
Vanadium dioxide (VO2) is an intruiging compound, since upon heating it exhibits an insulator-to-metal transition (IMT) at a critical temperature Tc of around 340 K, which is characterised by a decrease in resistivity of several orders of magnitude. On a microscopic level, the phase transition is accompanied by a rearrangement of the crystal structure as well as electronic bands around the Fermi level and proceeds in a percolative manner, meaning that both phases coexist over a temperature range of several K around Tc.
Here, we present results of an experiment which combines X-ray spectroscopic methods for electronic structure analysis with imaging capabilities of a few micrometers spatial resolution. Studying electronic structure changes during the thermally driven IMT in a pulsed laser deposition-grown and microstructured VO2 thin film, shows that Tc differs by around 2 K between the edges and centres of VO2 squares with an edge length of 30 µm.