Dresden 2020 – scientific programme
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O: Fachverband Oberflächenphysik
O 86: Poster Session - Organic Molecules on Inorganic Substrates: Electronic, Optical and other Properties II
O 86.7: Poster
Wednesday, March 18, 2020, 18:15–20:00, P2/EG
How Metrology can improve Photoemission Tomography — •Hans Kirschner1, Alexander Gottwald1, Georg Koller4, Peter Puschnig4, Mike Ramsey4, Mathias Richter1, Serguei Soubtach2,3, and Stefan Tautz2,3 — 1Physikalisch-Technische Bundesanstalt, 10587 Berlin, Germany — 2Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, 52425 Jülich, Germany — 3ülich Aachen Research Alliance (JARA), Fundamentals of Future Information Technology, 52425 Jülich, Germany — 4Institut für Physik, Karl-Franzens-Universität Graz, NAWI Graz, 8010 Graz, Austria
Photoemission tomography (PT) is a powerful tool to identify the electron orbital structure of mono-and bi-layers of molecules on surfaces. Using angle-resolved photoemission spectroscopy and assuming a basic plane wave as the final state of the photoelectrons, the molecular orbital can generally be represented by a Fourier Transformation of the resulting impulse map. Thus, detailed information on electronic and geometric structures, as well as orbital densities of molecular systems on different surfaces is extracted.
In order to receive accurate relative electron densities of the orbitals, it already has been shown that a normalization to the precise photon flux is essential. In this context, we seek to apply the PT method to experimental datasets for angle-resolved photoemission of atomic photoionization. The resulting impulse distributions will be compared to those, received from analytically calculated hydrogen-like atomic orbitals, in order to show and overcome differences in the electron densities of the orbitals due to the PT method.