Hannover 2020 – scientific programme
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A: Fachverband Atomphysik
A 4: Clusters I (joint session MO/A)
A 4.2: Talk
Monday, March 9, 2020, 11:30–11:45, f102
Photon-energy dependent ionisation of isolated Xenon atoms — Thomas Baumann1, Rebecca Boll1, Markus Ilchen1, Joakim Laksman1, Tommaso Mazza1, Michael Meyer1, Valeria Musić1, Daniel Rivas1, •Aljoscha Rörig1, Svitozar Serkez1, Philipp Schmidt1, Sergey Usenko1, Julia Schäfer2, Robin Santra2, Sang-Kil Son2, Shashank Pathak3, Daniel Rolles3, and Benjamin Erk4 — 1European XFEL GmbH, Schenefeld, Germany — 2Center for Free-Electron Laser Science (CFEL), Hamburg, Germany — 3Kansas State University, Manhattan, USA — 4Deutsches Elektronen-Synchrotron (DESY), Hamburg, Germany
In October 2019 we investigated the photon-energy-dependence of the ionisation process of isolated Xenon atoms exposed to extremely intense soft X-ray radiation at the European XFEL free-electron laser in Schenefeld, Germany. We were able to tune the photon energy over a wide range (700 eV - 3000 eV) while maintaining constant high pulse energy of several millijoule. As a function of photon energy, we detected distinct variations of the ion yield in certain charge state regions due to non-linear effects, and extreme-charge states up to +42 of Xenon. These variations are the result of transient resonances that increase the photoionisation cross section at certain charge states and photon energies, as the binding energies in the atomic orbitals shift as a result of increasing charge state during a single FEL pulse. The experimentally obtained data is in good accordance with the calculated charge state distributions, thus allowing us a detailed insight into the transient electronic structure of highly excited atoms.