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Q: Fachverband Quantenoptik und Photonik
Q 43: Quantum Optics and Photonics
Q 43.6: Vortrag
Donnerstag, 12. März 2020, 12:15–12:30, f342
VCSEL-Based Planar Optical Near Field Sensor for Precision Measurement Applications — •Axel Günther1,3, Bernhard Roth2,3, and Wolfgang Kowalsky1,3 — 1TU Braunschweig, Institute of High Frequency Technology, Schleinitzstr. 22, 38106 Braunschweig — 2Leibniz Universität Hannover, Hannover Centre for Optical Technologies, Nienburger Str. 17, 30167 Hannover — 3Cluster of Excellence PhoenixD (Photonics, Optics and Engineering - Innovation Across Disciplines), Hannover
During the last years, optical information technology relying on semi-conductor materials, light sources, and detectors as well as lithographic fabrication techniques gained increasing attention due to the high integration density and large transmission rates. In this field, novel sensor concepts which can easily be incorporated into an optical network array for flexible and versatile measurement, e.g., the 2D spatially resolved acquisition of physical quantities such as strain, shape deformation, and temperature, or the sensitive and specific detection of liquid and gaseous trace substances offer great application potential.
We present a new type of near-field optical sensor which has potential to be used as a high-resolution measurement device with axial resolution at the micrometer scale or below. The concept relies on an optical feedback signal generated in a VCSEL-based compound cavity and might enable fast and reliable topography determination of diverse structures. Preliminary experiments will be presented and compared to simulation results indicating the measurement capabilities of the device.