SKM 2021 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 4: Poster
DS 4.23: Poster
Dienstag, 28. September 2021, 10:00–13:00, P
The Dielectric Tensor of Microtextured Squaraine Thin Films obtained by Imaging Mueller Matrix Ellipsometry — •Manuela Schiek1, Sebastian Funke2, Matthias Duwe2, Peter H. Thiesen2, Kurt Hingerl1, and Frank Balzer3 — 1Johannes Kepler University of Linz, Austria. — 2Accurion GmbH Göttingen, Germany. — 3University of Southern Denmark, DK.
Imaging Mueller matrix ellipsometry combines the power of variable angle spectroscopic ellipsometry and optical microscopy mapping. Here we illustrate the determination of the full biaxial dielectric tensor of an organic material crystallizing in an orthorhombic phase. This is achieved by analyzing thin film samples with a single crystallographic orientation parallel to the substrate subdivided in micro-sized rotational domains. Oscillator dispersion relations reasonably model the diagonal tensor components and reproduce well the Davydov splitting of the material.
[1] Funke, Duwe, Balzer, Thiesen, Hingerl, Schiek. J. Phys. Chem. Lett. 19 (2021) 3053.