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DS: Fachverband Dünne Schichten

DS 4: Poster

DS 4.23: Poster

Dienstag, 28. September 2021, 10:00–13:00, P

The Dielectric Tensor of Microtextured Squaraine Thin Films obtained by Imaging Mueller Matrix Ellipsometry — •Manuela Schiek¹, Sebastian Funke², Matthias Duwe², Peter H. Thiesen², Kurt Hingerl¹, and Frank Balzer³ — ¹Johannes Kepler University of Linz, Austria. — ²Accurion GmbH Göttingen, Germany. — ³University of Southern Denmark, DK.

Imaging Mueller matrix ellipsometry combines the power of variable angle spectroscopic ellipsometry and optical microscopy mapping. Here we illustrate the determination of the full biaxial dielectric tensor of an organic material crystallizing in an orthorhombic phase. This is achieved by analyzing thin film samples with a single crystallographic orientation parallel to the substrate subdivided in micro-sized rotational domains. Oscillator dispersion relations reasonably model the diagonal tensor components and reproduce well the Davydov splitting of the material.

[1] Funke, Duwe, Balzer, Thiesen, Hingerl, Schiek. J. Phys. Chem. Lett. 19 (2021) 3053.