SKM 2021 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 4: Poster

DS 4.6: Poster

Dienstag, 28. September 2021, 10:00–13:00, P

Measuring Material-Specific Properties with Ultra-High Vacuum Atomic Force Microscopy — •Frederic Luis Condin, Jesús Sánchez Lacasa, and Baran Eren — Department of Chemical and Biological Physics, Weizmann Institute of Science, Rehovot, Israel

The real-space imaging capabilities provided by scanning probe microscopy techniques have undoubtedly revolutionized the scientific study of surfaces and processes happening thereon. Whereas scanning tunneling microscopy is limited to conductive samples, atomic force microscopy can be used for any surface. A general problem of scanning probe microscopy is its lack of element specificity, i.e., it cannot be used for the identification of materials or adsorbed surface species without additional information or prior knowledge about the sample. We address this problem and present contributions towards the chemical identification of surface materials. To this end, we calculate Hamaker constants on different points of a sample from bias voltage and tip-sample distance dependent measurements of the frequency shift in amplitude and frequency modulation atomic force microscopy.