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HL: Fachverband Halbleiterphysik

HL 19: Poster Session IV

HL 19.2: Poster

Donnerstag, 30. September 2021, 13:30–16:30, P

Electroreflectance as a Powerful Tool to Investigate Internal Device Parameters in CIGS Solar Cells — •Lennart Meyer¹, Jonas Grutke¹, Wolfram Witte², Dimitrios Hariskos², Heinz Kalt¹, and Michael Hetterich^1,3 — ¹Institute of Applied Physics, Karlsruhe Institute of Technology (KIT), 76131 Karlsruhe, Germany — ²Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden-Württemberg (ZSW), 70563 Stuttgart, Germany — ³Light Technology Institute, KIT, 76131 Karlsruhe, Germany

Recently, our group has developed and successfully utilized various advanced electroreflectance (ER) spectroscopy techniques for the destruction-free analysis of Cu(In,Ga)Se₂ (CIGS) solar cell absorber and buffer layers in full devices, including investigations into interdiffusion phenomena and secondary phase formation. In this contribution, we present first steps towards a novel ER approach that shall enable the determination of internal device parameters such as the built-in potential drop at the absorber-buffer interface, the carrier concentration in the absorber, or the width of the space charge region. To this end, the variation of the CIGS bandgap resonance amplitude in the ER spectra is analysed as a function of the simultaneously applied AC and DC reverse biases, respectively. The cell parameters can then be obtained via theoretical modelling of the experimental data. First examples and applications of this method will be discussed.