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O: Fachverband Oberflächenphysik
O 52: Poster Session IV: Poster to Mini-Symposium: Infrared nano-optics II
O 52.3: Poster
Tuesday, March 2, 2021, 13:30–15:30, P
Infrared-visible sum-frequency generation microscopy of phonon polariton resonances in SiC nanorods — •Sören Wasserroth1, Richarda Niemann1, Guanyu Lu2, Martin Wolf1, Joshua D. Caldwell2, and Alexander Paarmann1 — 1Fritz-Haber-Institut, Berlin, Germany — 2Vanderbilt University, Nashville, USA
Sum-frequency generation (SFG) allows the study of surfaces and inversion broken systems. In a new approach we implemented a wide field sum-frequency microscope combining an infrared free electron laser (IR FEL) as excitation source with visible upconversion. The IR FEL provides a powerful, narrow band, and tunable light source [1]. By direct imaging of the SFG light with a microscope in a wide field scheme without scanning the sample or the focus [2], we achieve a spatial resolution well beyond the infrared diffraction limit.
We use SFG microscopy to image phonon polariton resonances in subdiffractional SiC nanorods. Full spectral mapping of the structures allows spectroscopic identification of the various polariton resonances(∼ 900 cm−1). Additionally, the high spatial resolution of the microscope resolves the modal structure of polaritons within each nanorod. We follow the evolution of the polariton modes by varying the geometrical parameters of the rods. As we demonstrate here, SFG microscopy presents itself as an excellent novel tool to comprehensively study infrared polaritons in subdiffractional nanostructures.
[1] Schöllkopf et al., Proc. of SPIE (2015)
[2] Kiessling et al., ACS Photonics (2019)