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O: Fachverband Oberflächenphysik

O 55: Poster Session IV: Poster to Mini-Symposium: Machine learning applications in surface science II

O 55.8: Poster

Dienstag, 2. März 2021, 13:30–15:30, P

Automated Tip Functionalization and Image interpretation with Machine Learning in Atomic Force Microscopy — Benjamin Alldritt¹, Chen Xu¹, Prokop Hapala³, Niko Oinonen², •Fedor Urtev¹, Lauri Kurki², Ondrej Krejci¹, Filippo Federici Canova¹, Juho Kannala¹, Peter Liljeroth¹, and Adam Foster¹ — ¹Aalto University, Espoo, Finland — ²University of Helsinki, Finland — ³Czech Academy of Sciences, Prague, Czechia

Atomic force microscopy (AFM) is ubiquitous nanoscale characterisation technique to measure a 3D map of surface roughness at atomic resolutions [1]. AFM data interpretation and quantitative analysis for complex mixtures of molecules and bulky 3D molecules can be difficult [2], due to the complex nature of contrast in AFM images, and need significant acceleration and automation to make AFM technique available to a wide range of laboratories and clinics. Here, we introduce a machine learning (ML) approach both for the preparation of AFM experiments and for data interpretation in AFM. For the first objective our method involves a convolutional neural network (CNN) that has been trained to analyse the quality of a CO-terminated tip. For the interpretation of AFM images, we introduce ML image descriptors characterising the molecular configuration, allowing us to predict the molecular structure directly. [1] L. Gross et al., Science, vol. 325, no. 5944, (2009). [2] O. M. Gordon and P. J. Moriarty, Mach. Learn. Sci. Technol., vol. 1, no. 2, (2020).