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O: Fachverband Oberflächenphysik
O 66: Poster Session V: 2D Materials: Electronic structure, excitations, etc. I
O 66.11: Poster
Wednesday, March 3, 2021, 10:30–12:30, P
Atomic-scale characterization of few-layer Cr5Se8 — •Paul Dreher1, Wen Wan1, Carmen Gonzalez Orellana2, Max Ilyn2, Javier Herrero-Martin3, Pierluigi Gargiani3, Marco Gobbi4, Santiago Blanco-Canosa4, and Miguel Ugeda1 — 1Donostia International Physics Center, Donostia - San Sebastián, Spain — 2Centro de Física de Materiales (CSIC-UPV/EHU) — 3ALBA Synchrotron Light Source — 4CIC Nanogune
The realization of magnetic order at the two-dimensional limit is currently a priority for Materials Science. In this arena, transition metal chalcogenides have emerged as candidate magnetic 2D materials with unprecedented robust chemical stability, which could enable their integration in durable, flexible magnetic devices. Here we perform combined atomic-scale structural and electronic characterization of few layer Cr5Se8 with its mesoscopic magnetic characterization. We have studied the atomic, electronic and magnetic structure of MBE-grown few-layer Cr5Se8 on graphene substrates (BLG/SiC(0001) and HOPG) by means of 4.2K-STM/STS and XMCD measurements. STM imaging reveals that Cr5Se8 present both Se- and Cr-terminations, the latter showing a 2x2 periodicity in the Cr plane stable up to room temperature. Both terminations exhibit a semiconducting behavior with an accused layer-dependent gap value maximized at 1.2 eV for three layers. Lastly, our XMCD measurements are compatible with a weak ferromagnetic ground state down to 2K.