O 77: Poster Session VI: Scanning probe techniques: Method development I
Wednesday, March 3, 2021, 13:30–15:30, P
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13:30 |
O 77.1 |
Identifying the atomic configuration of the tip apex using STM and frequency-modulation AFM with CO on Pt(111) — •Oliver Gretz, Alfred J. Weymouth, and Franz J. Giessibl
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13:30 |
O 77.2 |
Strumming a Single Chemical Bond — •Alfred J. Weymouth, Elisabeth Riegel, Oliver Gretz, and Franz J. Giessibl
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13:30 |
O 77.3 |
Bond-Level Imaging of Organic Molecules Using Q-Controlled Amplitude Modulation Atomic Force Microscopy — •Daniel Martin-Jimenez, Alexander Ihle, Sebastian Ahles, Hermann A. Wegner, André Schirmeisen, and Daniel Ebeling
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13:30 |
O 77.4 |
High-precision atomic force microscopy with atomically-characterized tips — •Alexander Liebig, Angelo Peronio, Daniel Meuer, Alfred J. Weymouth, and Franz J. Giessibl
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13:30 |
O 77.5 |
Charging single metal nanoparticles grown on thin alumina films by the AFM tip — Baptiste Chatelain, •Ali El Barraj, Clemence Badie, Lionel Santinacci, and Clemens Barth
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13:30 |
O 77.6 |
Ultra-Shallow Dopant Profiles in H:Si(001) as In-Situ Electrodes in Scanning Probe Microscopy — •Alexander Kölker, Takashi Kumagai, Martin Wolf, and Matthias Koch
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