SurfaceScience21 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 9: Poster Session I: New methods I
O 9.3: Poster
Montag, 1. März 2021, 10:30–12:30, P
Biaxial atomically resolved force microscopy based on a qPlus sensor operated simultaneously in the first flexural and length extensional modes — •Dominik Kirpal1, Jinglan Qiu1,2, Korbinian Pürckhauer1, Alfred J. Weymouth1, Michael Metz1, and Franz J. Giessibl1 — 1Institute of experimental and applied physics, University of Regensburg, Regensburg, Germany — 2College of Physics and Hebei Key Laboratory of Photophysics Research and Application, Hebei Normal University, Shijiazhuang, Hebei, China
In frequency-modulation atomic force microscopy typically the tip is driven to oscillate vertically, giving a measure of the vertical force component. However, for many systems the lateral force component of force provides valuable information about the sample. Measuring lateral and vertical force components simultaneously by oscillating vertically and laterally has so far only been demonstrated with relatively soft silicon cantilevers and optical detection. Here, we show that the qPlus sensor can be used in biaxial mode with electrical detection by making use of the first flexural mode and the length extension mode. We describe the necessary electrode configuration as well as the electrical detection circuit, and compare the length extension mode to the needle sensor. Finally, we show atomic resolution in ambient conditions of a mica surface and in ultra-high vacuum of a silicon surface. With this, we show how any qPlus AFM setup can be modified to work as a biaxial sensor, allowing two independent force components to be recorded.