Heidelberg 2022 – wissenschaftliches Programm

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T: Fachverband Teilchenphysik

T 12: Pixel Detectors

T 12.4: Vortrag

Montag, 21. März 2022, 17:00–17:15, T-H25

ATLAS ITKPix Waferprobing — •Mark Standke, Yannick Dieter, Tomasz Hemperek, Florian Hinterkeuser, Fabian Hügging, Hans Krüger, David-Leon Pohl, Marco Vogt, and Jochen Dingfelder — Forschungs- und Technologie-Zentrum Detektorphysik - Kreuzbergweg 26, 53115 Bonn

Wafer-probing is a process, in which each individual chip is tested for its key function parameters on wafer level. For this purpose, Bonn has developed a fast and versatile testing and analysis environment, making large-scale testing for ATLAS-ITkPix possible. ITkPix is the first full-scale 65 nm ATLAS - hybrid pixel-detector readout chip, developed by the RD53 collaboration. ITkPix consists of more than one billion transistors with high triplication ratio in order to cope with high particle and therefore radiation densities at the heart of ATLAS. The chips will be located as close as possible to the interaction point to optimize impact parameter resolution. ITkPix features a single low power, low noise analog front-end to ensure high readout speeds and low detection thresholds. A failure of such chips at the heart of ATLAS is assumed to be hard to correct. Therefore, thorough testing is necessary. This talk will give an overview over the testing environment, while summarizing the latest results and performance of ATLAS's future inner tracker performance driver, ITkPix.