Regensburg 2022 – scientific programme
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BP: Fachverband Biologische Physik
BP 7: Poster 1
BP 7.36: Poster
Monday, September 5, 2022, 18:00–20:00, P1
Topological artifacts in mid-IR photo-induced force microscopy (PiF-IR) — •Sajib Barua1,2, Hardik Gadher1,3, Uwe Hübner1, and Daniela Täuber1,2 — 1Leibniz Institute of Photonic Technology, Jena — 2Institute of Physical Chemistry & Abbe Center of Photonics, Friedrich-Schiller-University Jena, Germany — 3Leibniz University Hannover, Germany
The use of tapping mode atomic force microscopy (AFM) for detecting mid IR absorption can provide nanoscale chemical information. Several studies report on successful applications for qualitative characterization of biomaterials [1]. Implementing such methods for quantitative evaluation of chemical sample compositions requires further understanding of underlying physical processes [2]. In general, the surface of biological cells and tissue is rough on a sub-micron scale. This may cause artifacts in signal detection due to non-planar interactions with the AFM tip. We use structured polymer layers to investigate implications of sample topography on the signal intensity in mid-IR photo-induced force microscopy (PiF-IR). -- [1] Wang et al. Super-Resolution Mid-Infrared Spectro-Microscopy of Biological Applications through Tapping Mode and Peak Force Tapping Mode Atomic Force Microscope. Adv. Drug Deliv. Rev. 2022, 180. [2] Täuber et al. Interference Effects in Nanoscale Infrared Spectroscopy Methods, submitted.