Regensburg 2022 – scientific programme
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CPP: Fachverband Chemische Physik und Polymerphysik
CPP 12: Poster 1
CPP 12.21: Poster
Monday, September 5, 2022, 18:00–20:00, P1
Unravelling Superpositions in GI-XPCS by simultaneous GT-GI-XPCS on Spincoated Thin Films — •Christopher R. Greve1, Meike Kuhn1, Fabian Eller1, Guillaume Freychet3, Alexander Hexemer2, Lutz Wiegart3, and Eva M. Herzig1 — 1Dynamik und Strukturbildung - Herzig Group, Universität Bayreuth, Universitätsstr. 30, 95447 Bayreuth, Germany — 2CAMERA, Lawrence Berkeley National Lab Berkeley CA, USA — 3NSLSII, Brookhaven National Lab, Upton NY, USA
X-Ray Photon Correlation Spectroscopy (XPCS) is a flexible tool to quantify dynamics on the nanometer scale in bulk samples and is used in grazing incidence (GI) geometry for application to thin films. By measurements in GI geometry distortions to the scattering signal are introduced, related to refraction and reflection events, known from the Distorted Wave Born Approximation (DWBA). These reflection and refraction events lead to superpositions of signal on the detector, resulting in alterations of analyzed quantities. We applied an approach to quantify the influence of events within the DWBA on decorrelation analysis by measuring grazing incidence transmission (GT) XPCS and GI-XPCS simultaneously for various thin films. Combining GI-GT-XPCS results with calculations of Fresnel coefficients within the simplified DWBA the origin of scattering contributions is determined. Calculations of the non-linear effect of refractions are added to identify comparable regions within GI and GT. Thus, elucidating differences for phenomena like altered decorrelation times, allowing a valid analysis of GI-XPCS experiments for certain experimental conditions.