DS 23: Optical Analysis of Thin Films (Reflection, Ellipsometry, Raman, IR-DUV Spectroscopy, ...)
Donnerstag, 8. September 2022, 10:45–12:15, H14
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10:45 |
DS 23.1 |
Raman characterisation of composite thin films of PEDOT:PSS and Cu2ZnSnS4 nanocrystals — •Yevhenii Havryliuk, Volodymyr Dzhagan, Oleksandr Selyshchev, and Dietrich R.T. Zahn
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11:00 |
DS 23.2 |
dielectric function of Al(1-x)ScxN obtained by spectroscopic ellipsometry. — •Younes Slimi, Rebecca Petrich, Rüdiger Schmidt-Grund, Hauke-Lars Honig, Christina Helm, Heike Bartsch, Jens Müller, Peter Schaaf, and Stefan Krischok
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11:15 |
DS 23.3 |
The contribution has been withdrawn.
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11:30 |
DS 23.4 |
Time-resolved femtosecond ellipsometry — •Shirly Espinoza
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11:45 |
DS 23.5 |
Chalcogenides for Photonic Applications in the Visible — •Felix Hoff, Carl-Friedrich Schoen, Maximilian Mueller, Yiming Zhou, Peter Kerres, Häser Maria, and Matthias Wuttig
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12:00 |
DS 23.6 |
IR dual-comb polarimetry of a nanofiber scaffold — •Karsten Hinrichs, Brianna Blevins, Andreas Furchner, Nataraja Sekhar Yadavalli, Sergiy Minko, Raphael Horvath, and Markus Mangold
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