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DS: Fachverband Dünne Schichten

DS 23: Optical Analysis of Thin Films (Reflection, Ellipsometry, Raman, IR-DUV Spectroscopy, ...)

DS 23.4: Vortrag

Donnerstag, 8. September 2022, 11:30–11:45, H14

Time-resolved femtosecond ellipsometry — •Shirly Espinoza — ELI Beamlines, Institute of Physics, Czech Academy of Science, Prague, Czech Republic

The ellipsometry technique is well extend for the study of thin film material. Thanks to femtosecond pulse lasers, we developed a time-resolved femtosecond ellipsometry technique, where a pump beam from any wavelength between 200 nm and 2000 nm excite the material and second pulse, the probe beam, with a continuous spectrum from 350 nm * 750 nm measure the dielectric function of the material. The pump and the probe beam can be separated in time from femtoseconds until nanoseconds generating a time-scan of the relaxation of the material. The time-resolved ellipsometry technique is available to the scientific community at the user-oriented infrastructure ELI Beamlines located few kilometers from Prague, Czech Republic. Examples of successful experiments will be presented and the details of how to apply for beamtime will be shared.