Regensburg 2022 – scientific programme
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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur
KFM 24: New Methods and Developments: Spectroscopies, Diffraction and Others (joint session O/KFM)
KFM 24.1: Topical Talk
Thursday, September 8, 2022, 10:30–11:00, H6
Element and Structure Analysis of Surfaces Using Positrons — •Christoph Hugenschmidt — Forschungs-Neutronenquelle Heinz Maier-Leibnitz (MLZ), Technische Universität München, Lichtenbergstr. 1, 85748 Garching, Germany
With the advent of bright low-energy positron beams novel analysis tools have been developed exploiting the unique properties of positron matter interaction such as repulsive crystal potential or positron trapping in surface states [1]. Positron annihilation is established for defect spectroscopy and the characterization of the free volume in amorphous matter. By applying a slow positron beam, however, defects near the surface can be specifically addressed, e.g. for the determination of the oxygen vacancy concentration in YBa2Cu3O7−x [2]. The positron counterparts of reflection high-energy electron diffraction (RHEED) and electron induced Auger-electron spectroscopy (AES) intrinsically exhibit superior surface sensitivity. In contrast to electrons, positrons show total reflection for small glancing angles. It was demonstrated that with reflection high-energy positron diffraction the structure of the topmost and the immediate subsurface atomic layer of surfaces are revealed with outstanding accuracy. The main advantages of positron annihilation induced AES are the missing secondary electron background and its topmost layer sensitivity for element analysis allowing, e.g. the in-situ observation of the Ni adatom migration from the Pd surface into the bulk [3]. [1] C. H.; Surf. Sci. Reports 71 (2016) 547; [2] M. Reiner et. al.; Phys. Rev. B 97 (2018) 144503; [3] S. Zimnik et. al.; Surf. Sci. 664 (2017) 61