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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur

KFM 25: Poster

KFM 25.2: Poster

Donnerstag, 8. September 2022, 15:00–18:00, P2

Strain and defect location in the cross-section of laterally aligned SnO2 NWs — •Jasmin-Clara Bürger, Sebastian Gutsch, and Margit Zacharias — Laboratory for Nanotechnology, Department of Microsystems Engineering - IMTEK, University of Freiburg, Georges-Köhler-Allee 103, 79110 Freiburg, Germany

The 1D structure and the high surface-to-volume ratio of SnO2 nanowire-based devices allow for high sensitivities in gas- and biosensing. By their self-alignment towards the substrate edge and by the self-alignment of the SnO2 nanowire crystal lattice towards the atomic arrangement on the substrate surface[1], laterally aligned SnO2 NWs are superior to freestanding NWs as a basic structure for a single-NW-based sensor. However, up to now, only little is known about their crystal quality compared to the excellent material quality of freestanding NWs. Hence, here, laterally aligned SnO2 NWs on r-plane sapphire substrates were grown by the vapor-liquid-solid mechanism and morphologically analyzed by scanning electron microscopy. By focused-ion beam preparation, cross-sectional TEM lamellas of the laterally aligned SnO2 NWs on r-plane sapphire were prepared. For analysis of the NW defect density, post-processed strain maps were computed of atomically resolved TEM images. The theoretical background for the experimentally observed location of the lowest strain density close to the substrate-NW interface and the highest defect density close to the NW surface will be discussed.

[1] J.-C. Bürger et al., Cryst. Growth Des. (2021), 21 (1), 191-199