Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe

MA: Fachverband Magnetismus

MA 19: Poster 1

MA 19.57: Poster

Dienstag, 6. September 2022, 17:30–20:00, P2

Investigation of the surface structure of Y₃Fe₅O₁₂ thin films by X-ray photoelectron spectroscopy and diffraction (XPS and XPD) — •Thomas Ruf¹, Philip Trempler², Georg Schmidt², and Reinhard Denecke¹ — ¹Wilhelm-Ostwald-Institut, Universität Leipzig — ²Institut für Physik, Martin-Luther-Universität Halle-Wittenberg

Y₃Fe₅O₁₂ (YIG) is a ferrimagnetic and insulating material with low ferromagnetic resonance (FMR) linewidth and damping constant. High surface quality and complete epitaxial growth are important for YIG thin films. High-quality YIG thin films are good candidates for integrated magnonics and spin injection in YIG/metal bilayers.

XPD measurements for assignment of the surface structure of pulsed laser deposited, high quality and pseudomorphic YIG(100) on Gd₃Ga₅O₁₂(100) and YIG(111) on Gd₃Ga₅O₁₂(111) 50 nm thin films were conducted. XPS angular intensity anisotropies for high kinetic energy lines Y 3d (E_kin = 1329 eV), Fe 3p (E_kin = 1430 eV) and O 1s (E_kin = 957 eV) of the thin films can be interpreted in the forward focusing regime as a bulk-like (SG Ia3d) surface structure. Simplifying the interpretation to forward focusing allows for interpretation as a real space scan. The normalized intensity for Y 3d and Fe 3p lies in the range of 0.85 to 1.2 and approx. 0.9 to 1.1 for O 1s. This confirms epitaxial coherence reaching to the film surface, as XPD effects are restricted to few atomic layers. The measured XPS quantification ratios of 1.1 and 1.2 for [Y]/[Fe], compared to nominally 0.6, can only be partly explained by those XPS angular intensity anisotropies.