Regensburg 2022 – scientific programme
Parts | Days | Selection | Search | Updates | Downloads | Help
MA: Fachverband Magnetismus
MA 20: Focus Session: Revealing Multidimensional Spin Textures and their Dynamics via X-rays and Electrons
MA 20.2: Invited Talk
Wednesday, September 7, 2022, 10:00–10:30, H37
Magnetic depth profiling with x-ray resonant magnetic reflectivity (XRMR) — •Timo Kuschel — Department of Physics, Bielefeld University, 33615 Bielefeld, Germany
Magnetic depth profiling is one of the important thin-film characterization techniques in today’s condensed matter physics and, in particular, in the spintronic research field. The interference of reflected light from the interfaces of a magnetic thin-film system depends on its magnetic state. Thus, the detected reflectivity of typically circularly polarized light provides information on the depth profile of the sample’s magnetization. By the use of synchrotron x-rays, this dependence becomes element-selective as long as the absorption energy of a specific chemical element is used as photon energy. Therefore, the analysis of the x-ray resonant magnetic reflectivity (XRMR) separates the individual magnetic depth profiles of different chemical elements [1].
In my contribution, I will introduce this experimental technique and emphasize advantages over standard x-ray magnetic circular dichroism detection [2]. I will discuss the quantitative comparability of XRMR with other experimental techniques [3] and present recent results on the magnetic proximity effect in platinum (Pt), palladium (Pd) and vanadium (V). Finally, I will highlight the cation- and lattice-site sensitivity of XRMR for the study of Fe3O4 and its interfaces [4].
[1] S. Macke, E. Goering, J. Phys. Cond. Matter 26, 363201 (2014)
[2] T. Kuschel et al., Phys. Rev. Lett. 115, 097401 (2015)
[3] D. Graulich, TK et al., Appl. Phys. Lett. 118, 089901 (2021)
[4] T. Pohlmann, TK et al. Phys. Rev. B. 102, 220411(R) (2020)