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O: Fachverband Oberflächenphysik

O 7: New Methods and Developments 1: Scanning Probe Techniques 1 (joint session O/KFM)

O 7.2: Vortrag

Montag, 5. September 2022, 11:00–11:15, S053

Coherent Noise Removal for Scanning Probe Microscopy — Jens Oppliger, Danyang Liu, and •Fabian Donat Natterer — Department of Physics, University of Zurich, Winterthurerstrasse 190, CH-8057, Switzerland

Despite the best efforts to isolate the weak signals in scanning probe microscopes from sources of noise, white and coherent noise remain major nuisances. While the presence of Gaussian white noise can be handled with temporal averaging, the influence of high-Q coherent noise, such as coming from ground-loops or mechanical resonances, is less straightforward to delete when rastering along the surface. Such noise leads to characteristic streaks and spurious Bragg peaks in the Fourier transform of two-dimensional data. Here we demonstrate a straightforward method to remove coherent noise using data-labelling and exemplify its working for quasiparticle interference and topographic imaging.