Regensburg 2022 – scientific programme
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VA: Fachverband Vakuumphysik und Vakuumtechnik
VA 2: Vacuum technology: New developments and applications
VA 2.4: Talk
Monday, September 5, 2022, 14:30–15:10, H12
Prevention of Carbon Contamination in Transmission Electron Microscopy by Sample-Specific Preparation — •Julia Menten1, Daniela Ramermann1, Robert Schlögl1,2, and Walid Hetaba1 — 1Max Planck Institute for Chemical Energy Conversion, Mülheim an der Ruhr, Germany — 2Fritz Haber Institute of the Max Planck Society, Berlin, Germany
Transmission electron microscopy (TEM) offers a powerful tool for the analysis of specimens down to an atomic scale. In order to achieve the best possible image resolution and quality of obtained data, sample preparation is a crucial step. Many samples contain a high carbon content, e.g. as organic ligands or solvents. Electron beam exposure can lead to the deposition of carbon on the specimen surface and limit the quality of the measurements.
In our work we focus on the removal of undesirable carbon species before the sample is inserted in the microscope. Our sample cleaning setup allows for investigation of the influence of different preparation parameters, e.g. drying time or temperature, on how long solvents remain in the vacuum system and therefore can have an impact on the TEM analysis. Evaluation of the decrease in pressure while pumping our setup with a TEM sample gives insight in necessary drying times. The effect of our sample treatment can be verified in the TEM by contrast and thickness measurements after electron beam exposure of the sample.