SAMOP 2023 – wissenschaftliches Programm
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A: Fachverband Atomphysik
A 27: Poster III
A 27.32: Poster
Donnerstag, 9. März 2023, 16:30–19:00, Empore Lichthof
Single-Pass Non-Destructive Ion Bunch Characterisation — •Stefan Ringleb1, Markus Kiffer1, Sugam Kumar2, Manuel Vogel3, Wolfgang Quint3,4, Gerhard G. Paulus1,5, and Thomas Stöhlker1,3,5 — 1Friedrich-Schiller-Universität Jena, Jena — 2Inter-University Accelerator Center, Delhi — 3GSI Helmholtzzentrum für Schwerionenforschung, Darmstadt — 4Ruprecht Karls-Universität Heidelberg, Heidelberg — 5Helmholtzinstitut Jena, Jena
In recent years, ion beam applications in research and industry increased much. Especially, low-energy beamlines have shrunk to tabletop size and can be set up fast and with comparably low financial effort.
In most applications each ion bunch passes the beamline only once and there is a need to characterise the ions non-destructively within a single pass. To this end, we have developed, built and tested two devices of different design based on the measurement of induced mirror charges of the passing ions in a set of pick-up electrodes. We have elaborated a robust evaluation procedure and have tested the devices in the energy regime of keV.
One device is capable of measuring the number and kinetic energy of an ion bunch and the second is used to determine the position of the ion beam with respect to the beamline centre.
We will present the device and its physical background as well as characterisation results.