SAMOP 2023 – wissenschaftliches Programm
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Q: Fachverband Quantenoptik und Photonik
Q 66: Quantum Metrology (joint session QI/Q)
Q 66.4: Vortrag
Freitag, 10. März 2023, 11:45–12:00, F428
Quantum metrology from randomized measurements — •Satoya Imai1, Otfried Gühne1, and Géza Tóth2,3,4,5 — 1Naturwissenschaftlich-Technische Fakultät, Universität Siegen, Walter-Flex-Str. 3, 57068 Siegen, Germany — 2Department of Theoretical Physics, University of the Basque Country UPV/EHU, P.O. Box 644, E-48080 Bilbao, Spain — 3Donostia International Physics Center (DIPC), ES-20080 San Sebastian, Spain — 4IKERBASQUE, Basque Foundation for Science, E-48013 Bilbao, Spain — 5Wigner Research Centre for Physics, Hungarian Academy of Sciences, P.O. Box 49, H-1525 Budapest, Hungary
A central task in quantum metrology is to consider a parameter encoding on a quantum system and to improve schemes to reach optimal precision. To reach higher precision, precise control of state preparation and favorable measurements may be necessary. In practice, however, unavoidable noise effects, such as magnetic field fluctuations, may affect the estimation accuracy. A key idea to address this situation is to perform a random measurement on the quantum system and access local unitary invariants. This procedure motivates the study of quantum metrology without a common reference frame between several parties. In this talk, we present a systematic method to investigate the estimation sensitivity in the dynamics based on nonlinear interaction Hamiltonians. We show that the well-known Heisenberg scaling is achievable and even better scaling is attainable.